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25th IEEE Asian Test Symposium
(ATS 2016)
November 21-24, 2016
International Conference Center Hiroshima, Hiroshima, Japan

http://aries3a.cse.kyutech.ac.jp/~ats16/

SUBMISSION DEADLINE EXTENDED TO JUNE 10, 2016
CALL FOR PAPERS

Scope

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
Major topics include, but are not limited to:

  • Automatic Test Pattern Generation (ATPG)
  • Analog Test / Mixed-Signal Test
  • Boundary Scan Test
  • Board and System Test
  • Built-In Self-Test
  • Design for Testability (DFT)
  • Design Verification and Validation
  • Defect-Based Testing
  • Delay and Performance Test
  • Diagnosis and Debug
  • Dependable System
  • Economics of Test
  • Fault Modeling and Simulation
  • Fault Tolerance
  • High-Speed I/O Test / RF Testing
  • Memory Test / FPGA Test
  • On-Line Test
  • System-on-a-Chip Test
  • System-in-package (SiP) / 3D Test
  • Software Testing / Software Design for Testing
  • Test Compression
  • Temperature / Power-aware Test
  • Test Quality
  • Yield Analysis and Enhancement

Submissions

Regular Submissions
The ATS'16 Program Committee invites original, unpublished paper submissions for ATS'16. Paper submissions should be complete manuscripts, up to six pages (including figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. An abstract of 50 words or less and 5-10 keywords are also required. All submissions are to be made electronically through the website. Electronic submissions in PDF files are strongly recommended. A submission will be considered as evidence that, upon acceptance, the author(s) will submit a fin al camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. The registration of at least one author is required for publication. For more information, email Program Chair Satoshi Ohtake: ats16-pc@aries30.cse.kyutech.ac.jp.

Industry Submissions
This session will address a wide range of practical problems in LSI test, board and system test, diagnosis, failure analysis, design verification, and so on. The session will consist of poster presentations and short oral presentations (optional). A one-page abstract is required for submission. Each submission should also include the complete address and designate a contact person and a presenter. All submissions are to be made by email to the Industry Chair Masahiro Ishida: ats16-ic@aries30.cse.kyutech.ac.jp.

Key Dates

Regular Submissions
Submission deadline: Fri May 27, 2016 (Extended!)
    Abstract registration: Fri June 3, 2016
    Paper PDF upload: Fri June 10, 2016
Notification of acceptance: Fri July 29, 2016
Camera ready copy: Wed August 31, 2016

Industry Submissions
Submission deadline: Fri July 8, 2016
Notification of acceptance: Fri July 29, 2016
Camera ready copy: Wed August 31, 2016
Additional Information

For general information:

For regular submission related information:

For industry submissions and related information:
Committee

General Co-Chairs

  • Tomoo Inoue - Hiroshima City University
  • Hiroshi Takahashi - Ehime University

General-Vice Chair

  • Yukiya Miura - Tokyo Metropolitan University

Program Chair

  • Satoshi Ohtake - Oita University

Program-Vice Chair

  • Hideyuki Ichihara - Hiroshima City University

Finance Chair

  • Yoshinobu Higami - Ehime University

Local Arrangement Chair

  • Kohei Miyase - Kyushu Institute of Technology

Registration Chair

  • Masayoshi Yoshimura - Kyoto Sangyo University

Publicity Chair

  • Stefan Holst - Kyushu Institute of Technology

Publications Chair

  • Hiroshi Yokoyama - Akita University

Industry Chair

  • Masahiro Ishida - Advantest Corp.

Tutorial Chair

  • Toshinori Hosokawa - Nihon University

Secretary

  • Masayuki Arai - Nihon University

North American Liaison

  • Nicola Nicolici - McMaster University

European Liaison

  • Erik Larsson - Lund University
For more information, visit us on the web at: http://aries3a.cse.kyutech.ac.jp/~ats16/

The 25th IEEE Asian Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR 
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

PAST CHAIR 
Michael NICOLAIDIS 
TIMA Laboratory - France 
Tel. +33-4-765-74696 
E-mail michael.nicolaidis@imag.fr

TTTC 1ST VICE CHAIR 
Matteo SONZA REORDA
Politecnico di Torino - ITALY
E-mail matteo.sonzareorda@polito.it

SECRETARY
Joan FIGUERAS
Un. Politec. de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

ITC GENERAL CHAIR 
Michael Purtell
Intersil - USA 
Tel. +1-408-372-6015 
E-mail m.purtell@ieee.org

TEST WEEK COORDINATOR
Yervant ZORIAN 
Synopsys, Inc.  - USA 
Tel. +1-650-584-7120  
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Paolo BERNARDI 
Politecnico di Torino - Italy
Tel. +39-011-564-7183
E-mail paolo.bernardi@polito.it

STANDARDS
Rohit KAPUR
Synopsys, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES 
André IVANOV 
University of British Columbia - Canada 
Tel. +1-604-822-6936 
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA 
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

  

PRESIDENT OF BOARD 
Yervant ZORIAN
Synopsys, Inc.  - USA 
Tel. +1-650-584-7120  
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR 
Adit D. SINGH  
Auburn University - USA  
Tel.  +1-334-844-1847  
E-mail adsingh@eng.auburn.edu

TTTC 2ND VICE CHAIR 
Rohit KAPUR 
Synopsys, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE 
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

IEEE DESIGN & TEST EIC 
André IVANOV
U. of British Columbia - Canada 
Tel. +1 
E-mail ivanov@ece.ubc.ca

TECHNICAL MEETINGS 
Chen-Huan CHIANG 
Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatel-lucent.com

TECHNICAL ACTIVITIES 
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39 090 7055
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC 
Kazumi HATAYAMA
Gumma University - Japan
Tel.+81-277-30-1111
E-mail k-hatayama@el.gunma-u.ac.jp

LATIN AMERICA 
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA 
André IVANOV 
University of British Columbia - Canada 
Tel. +1-604-822-6936 
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA 
Università di Bologna - Italy
Tel. +39-051-209-3038 
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.  - USA 
Tel. +1-650-584-7120  
E-mail Yervant.Zorian@synopsys.com

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